Fraunhofer Representative Office Japan
Fraunhofer Representative Office Japan

Events

TIA Nanotech International Workshop

Date & Time: February 15-16, 2010
Venue: The auditorium AIST Tsukuba Center 1 (http://www.aist.go.jp/aist_e/guidemap/tsukuba/tsukuba_map.html)
Fee: Registration: http://unit.aist.go.jp/ripo/ci/tia/.html

On the occasion of the nano tech 2010, METI and TIA-Nano (Tsukuba Innovation Arena) will hold an international workshop. The aim of this workshop is exchanging and sharing views to improve the performance of global nanotechnology research centers, focusing on the R&D and its organization management, as well as technical discussions on TIA-Nano's core research subjects.
Dr. H. Heuer from Fraunhofer Institute for Non-Destructive Testing IZFP will participate in this workshop with his presentation about the "Nanocharacterization in Germany" on February 16th.

<PROGRAM>

Feb.15

OPENING SESSION

10:00-10:20 
Opening & Welcome Speech
by Dr. Junji Itoh, Vice President of AIST (TIA)


MANAGEMENT SESSION (Mo-1)

10:20 - 10:40 
IMEC
by Dr. Chris Van Hoof, Director of Heterogeneous Integrated Microsystems

10:40-11:00
Albany NanoTech /College of Nanoscale Science & Engineering (CNSE) 
by Dr. Makoto Hirayama, Professor, Associate Vice President for Strategic 

11:00-11:20
MINATEC
by Dr. Laurent Malier, Director of MINATEC-Leti (Tentative)

11:20-12:00
Panel Discussion
 Moderetor: Dr. Hisatsune Watanabe, President and COE, Selete
Panelists: TIA, IMEC, Albany-CNSE, MINATEC  

 

NETWORKING BETWEEN NANOTECH RESEARCH CENTERS &  LABS (Mo-2)

13:20-13:40
National Nanotechnology Infrastructure Network (NNIN)
by Dr. Lawrence S. Goldberg, National Science Foundation  

13:40-14:00
Center for Integrated Nanotechnology (CINT)
by Prof. Bob Hwang, Director, Center for Integrated Nanotechnology

14:00-14:20
NanoNed
by Prof. Dr. Wilfred G. van der Wiel, Scientific Director NanoNed Japan Office  

14:20-14:40
Nanotechnology Network (Nanonet)
by Dr. Testuji Noda, Vice President, NIMS
 

14:40-15:10
Panel Discussion
Moderetor: 
Dr. Hisatsune Watanabe, President and COE, Selete
Panelists: NNIN, CINT, NanoNed, NIMS

15:10-15:30          Break    

 

 INTELLECTUAL PROPERTY (Mo-3)   

15:30-15:40
Introduction of Mo-3 session
by Dr. Shingo Ichimura, Vice President of AIST

15:40-16:00
IMEC 
by Dr. Chris Van Hoof,  Director of Heterogeneous Integrated Microsystems     

16:00-16:20
Albany-CNSE
by Prof. Makoto Hirayama, Associate Vice President for Strategic

16:20-16:40
MINATEC-LETI
by Dr. Laurent Malier, Director of MINATEC/Leti

16:40-17:00
National Center for industrial Property INPIT
by Mr. Yoshi Shibuya, Director of H.R.D. D. of INPIT

17:00-17:30
Discussion
Moderetor: 
Dr. Shingo Ichimura, Vice President of AIST(tentative)
IMEC, Albany-CNSE, MINATEC, INPIT  

18:00-19:30
Reception



Feb. 16   

NANOELECTRONCS (Tu-1)  

9:00-9:15
Introduction of Tu-1 session
Moderator:
Dr. Toshihiko Kanayama, AIST  

9:15-9:35 
“Green Nanoelecronics at TIA”
by Dr. Naoki Yokoyama, Fujitsu

9:35-9:55
“Nanophotonics at TIA”
by Prof. Yasuhiko Arakawa, Univ. Tokyo

9:55-10:05  
Comment
by Dr. Bernard S. Meyerson, IBM

10:05-10:15
Comment  
by Dr. Paolo Gargini, Intel
 

10:15-10:30      Break
 

10:30-12:00
Panel Discussion
Theme: “What are the most effective ways to develop Nanoelectronics for what application areas?”
Moderator: Dr. Toshihiko Kanayama, AIST
Panelists:
JAPAN:
Dr. Naoki Yokoyama, Fujitsu,  
Prof. Yasuhiko Arakawa, Univ. Tokyo
EUROPE:
Dr. Chris Van Hoof, IMEC 
US:
Prof. Makoto Hirayama, Albany-CNSE


N-MEMS (Tu-2)  

13:00-13:10 
"Introduction of Tu-2 session"
Moderator:
Dr. Ryutaro Maeda, AIST 

13:10-13:30 
"Challenge for the hetero-convergence" 
by Prof. Esahsi, University of Tohoku

13:30-13:50 
"Key issues for commercialization of MEMS" 
by Prof. Pisano, BSAC

13:50-14:10
"Competition and collaboration among research institutes"
by Dr. Laurent Malier, LETI (Tentative)

14:10-14:40
Discussion 
 

14:40-15:00          Break   


NANO-CHARACTERIZATION  (Tu-3)  

15:00-15:10
Introduction of Tu-3 session
Moderator:
Dr. Masataka Ohkubo, AIST

15:10-15:35
“The Assessment of External Needs:  Applying the United
States Measurement System and Subsequent Activities at NIST to Nanotechnology”
by Dr. Clare Allocca, NIST

15:35-16:00
“Nanocharacterization in Korea”
by Dr. Seong Jai Cho, KRISS

16:00-16:25 
“Nanocharacterization in Germany”
by Dr. Henning Heuer, Fraunhofer-Gesellschaft

16:25-16:35 
“AIST Open Innovation Platform for Nanocharacterization and Nanofabrication”
by Dr. Hiroyuki Akinaga, AIST

16:35-16:50
Discussion   

16:50
Concluding remarks
by Dr. Toshihiro Matsui, Program Director, AIST

17:00
Concluding session